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首页技术支持 Cardinal门控振荡器的表征

Cardinal门控振荡器的表征

来源:http://www.yijindz.com 作者:亿金电子 2024年03月02
Cardinal门控振荡器的表征,门控振荡器的稳定性和包络形状的测量
门控或键控振荡器快速打开和关闭。 这种类型的操作通常导致频率变化或 “唧唧喳喳”。对于带有抖动和定时分析包的勒克罗伊示波器来说,表征门控石英晶振的键控特性和频率稳定性是一项简单的工作。
图1显示了一个典型的在315MHz上测量,无钥匙进入系统发射机。这种设备使用键控连续波发送数字信号的发射器给接收者的信息位于车辆中。数据是通过控制爆发的宽度。
设计者感兴趣的是门控脉冲的形状包络和频率石英晶体振荡器的变化键控。的形状包络影响杂散信号的内容。同样的, 频率或相位调制造成的承运人的门控振荡器会影响信号纯度。这些中的任何一个 影响可能导致带外信号分量和未能满足的可能性 排放认证要求。
在图1中,前缘传输的波形是 在通道2中捕获,显示为顶部轨迹。跟踪A包含 极值数学函数称为roof,它提取每个周期的峰值传输信号。这个痕迹是 用于评估的上升时间爆裂。上升时间参数出现在第一个 参数读数的行 位于正下方 显示的痕迹。
迹线B,从上面数第三个, 包含抖动轨迹 频率和的函数 显示了中的变化频率是时间的函数。 请注意频率 收敛到标称值315大约250纳秒。这底部轨迹包含周期到周期的抖动跟踪 周期变化。这两个功能允许用户 指定振幅阈值 和滞后水平。贴片晶振这允许用户启动 测量仅在 信号已经达到合理水平。阈值水平 显示为水平虚线 来源行 波形(CH2)。请注意 抖动跟踪功能不启动直到阈值水平被已实现。这避免了错误 由读取噪音引起 波形的开始。



Cardinal门控振荡器的表征

Cardinal Components Inc Characterizing Gated Oscillators

Measuring Stability And Envelope Shape In Gated Oscillators

Gated or keyed oscillators are turned on and off rapidly. This type of operation often causes frequency changes or “chirps”. Characterizing the keying characteristics and frequency stability of gated oscillators is an easy job for LeCroy oscilloscopes with the jitter and timing analysis package.

Figure 1 shows a typical measurement on a 315 MHz keyless entry system transmitter. This type of device uses a keyed continuous wave (cw) transmitter to send digital information to the receiver located in a vehicle. Data is encoded by controlling the width of the burst.

Of interest to the designer is the shape of the gated burst envelope and the frequency variation as the oscillator is keyed. The shape of the envelope affects the spurious content of the signal. Likewise, frequency or phase modulation of the carrier caused by the gating the oscillator affects signal purity. Either of these effects can result in out of band signal components and a potential for failure to meet emissions certification requirements.

In figure 1 the leading edge of the transmitted waveform is captured in channel 2 shown as the top trace. Trace A contains the extrema math function called roof, which extracts the peak values of each cycle of the transmitted signal. This trace is used to evaluate the risetime of the burst. The risetime parameter appears on the first line of the parameter readout located directly below the displayed traces.

Trace B, third from the top, contains the JitterTrack function of frequency and shows the variation in frequency as a function of time. Note that the frequency converges to the nominal 315 MHz in about 250 ns. The bottom trace contains the JitterTrack of cycle to cycle period variation. Both of these functions allow the user to specify the amplitude threshold and hysteresis level. This allows the user to start the measurement only after the signal has achieved a reasonable level. The threshold level appears as a dotted horizontal line of the source waveform(CH2). Note that the JitterTrack function do not start until the threshold level is achieved. This avoids errors caused by reading noise at the beginning of the waveform. 
 

原厂编码 进口晶振 系列 Description描述
CJAE7L-A7BR-75.49472TS Cardinal晶振 CJAE OSCILLATOR 75.49472MHZ 3.3V SMD
CPPT4T-A7BP-00.8000TS Cardinal晶振 CPP PROG OSC 5V .8MHZ
CFE4-A7BP-155.52 Cardinal晶振 CFE4 OSC XO 155.52MHZ LVPECL SMD
CFE4-A7BP-156.25 Cardinal晶振 CFE4 OSC XO 156.25MHZ LVPECL SMD
CFE4-A7BP-212.5 Cardinal晶振 CFE4 OSC XO 212.50MHZ LVPECL SMD
CFE4-A7BP-311.04 Cardinal晶振 CFE4 OSC XO 311.04MHZ LVPECL SMD
CFE4-A7BP-622.08 Cardinal晶振 CFE4 OSC XO 622.08MHZ LVPECL SMD
CFL4-A7BP-155.52 Cardinal晶振 CFL4 OSC XO 155.52MHZ LVDS SMD
CFL4-A7BP-156.25 Cardinal晶振 CFL4 OSC XO 156.25MHZ LVDS SMD
CFL4-A7BP-212.5 Cardinal晶振 CFL4 OSC XO 212.50MHZ LVDS SMD
CFL4-A7BP-311.04 Cardinal晶振 CFL4 OSC XO 311.04MHZ LVDS SMD
CFL4-A7BP-622.08 Cardinal晶振 CFL4 OSC XO 622.08MHZ LVDS SMD
CFED-A7BP-155.52TS Cardinal晶振 CFED OSC XO 155.52MHZ LVPECL SMD
CFED-A7BP-156.25TS Cardinal晶振 CFED OSC XO 156.25MHZ LVPECL SMD
CFED-A7BP-212.5TS Cardinal晶振 CFED OSC XO 212.50MHZ LVPECL SMD
CFED-A7BP-311.04TS Cardinal晶振 CFED OSC XO 311.04MHZ LVPECL SMD
CFED-A7BP-622.08TS Cardinal晶振 CFED OSC XO 622.08MHZ LVPECL SMD
CFL-A7BP-155.52TS Cardinal晶振 CFL OSC XO 155.52MHZ LVDS SMD
CFL-A7BP-156.25TS Cardinal晶振 CFL OSC XO 156.25MHZ LVDS SMD
CFL-A7BP-212.5TS Cardinal晶振 CFL OSC XO 212.50MHZ LVDS SMD
CFL-A7BP-311.04TS Cardinal晶振 CFL OSC XO 311.04MHZ LVDS SMD
CFL-A7BP-622.08TS Cardinal晶振 CFL OSC XO 622.08MHZ LVDS SMD
CFVE-A7BP-155.52TS Cardinal晶振 CFVE OSC VCXO 155.52MHZ LVPECL SMD
CFVE-A7BP-156.25TS Cardinal晶振 CFVE OSC VCXO 156.25MHZ LVPECL SMD
CFVE-A7BP-212.5TS Cardinal晶振 CFVE OSC VCXO 212.50MHZ LVPECL SMD
CFVE-A7BP-311.04TS Cardinal晶振 CFVE OSC VCXO 311.04MHZ LVPECL SMD
CFVE-A7BP-622.08TS Cardinal晶振 CFVE OSC VCXO 622.08MHZ LVPECL SMD
CFVED-A7BP-155.52TS Cardinal晶振 CFVED OSC VCXO 155.52MHZ LVPECL SMD
CFVED-A7BP-156.25TS Cardinal晶振 CFVED OSC VCXO 156.25MHZ LVPECL SMD
CFVED-A7BP-212.5TS Cardinal晶振 CFVED OSC VCXO 212.50MHZ LVPECL SMD

 


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